embedded world 2013: model-based testing of multi-variant systems

Release from Mon., February 11, 2013

Fraunhofer FOKUS uses model-based testing methods to demonstrate how the quality assurance of complex systems can be carried out more efficiently and to a higher degree of quality at embedded world, which takes place in Nuremberg from February 26-28, 2013.

Berlin, 11th February 2013 – Complex systems now play an increasingly important role in industrial production. These systems allow many products to be specially manufactured in accordance with customer demands. A simple example is the configuration of new vehicles: whether it be a sports or an economy car, with or without air-conditioning - the product will be specially manufactured in order to meet customer demands.

However, a comprehensive test methodology is required in order for all vehicle systems to work in perfect harmony. For this purpose, the researchers at Fraunhofer FOKUS use model-based testing methods, which are based on so-called feature and behavioural models. In the feature models, the individual product variants are described. This could be, for example, a sports car with a sports engine and air conditioning. In addition, behavioural models are used for all product variants. These models describe precisely which functions the vehicles in the product family have.

By linking the two models, it is possible to generate test cases for a vehicle model at the touch of a button, which can be used to test the functions of complex systems, such as engine control, air conditioning, and their interaction. Moreover, this approach provides an opportunity to exploit similarities and to perform targeted tests on only the model-specific characteristics. This allows testing expenditure for the product family to be reduced significantly.

The Fraunhofer FOKUS researchers use both their own tools and existing tools available on the market for linking the models and for the automatic, model-based generation of test cases.

Fraunhofer researchers are holding an exhibit at embedded world 2013, in Hall 5, Stand 228 to demonstrate model-based test case generation for complex systems.